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1

[IEEE 2018 IEEE 10th International Conference on Humanoid, Nanotechnology, Information Technology,Communication and Control, Environment and Management (HNICEM) - Baguio City, Philippines (2018.11.29-2018.12.2)] 2018 IEEE 10th International Conference on Humanoid, Nanotechnology, Information Technology,Communication and Control, Environment and Management (HNICEM) - Development of a Dual Wind Turbines using the Savonius and Archimedes Spiral Principle

Ostia, Conrado, Martinez, Jesus M., Coderes, Kevin Ted, Estacio, Gino James, Ramchahi, Abdollah Rezvani, Pulido, Jargon V.

Year:

2018

Language:

english

File:

PDF, 178 KB

english, 2018

2

Optical Performance Monitoring Using Artificial Neural Networks Trained With Eye-Diagram Parameters

Jargon, J.A., Xiaoxia Wu, Willner, A.E.

Journal:

IEEE Photonics Technology Letters

Year:

2009

Language:

english

File:

PDF, 493 KB

english, 2009

3

[IEEE 48th ARFTG Conference Digest - Clearwater, FL, USA (1996.12.5-1996.12.6)] 48th ARFTG Conference Digest - Calibration Comparison Method for Vector Network Analyzers

Marks, Roger B., Jargon, Jeffrey A., Juroshek, John R.

Year:

1996

Language:

english

File:

PDF, 317 KB

english, 1996

4

ANN-Based Optical Performance Monitoring of QPSK Signals Using Parameters Derived From Balanced-Detected Asynchronous Diagrams

Xiaoxia Wu, Jargon, J.A., Paraschis, L., Willner, A.E.

Journal:

IEEE Photonics Technology Letters

Year:

2011

Language:

english

File:

PDF, 597 KB

english, 2011

5

Complex permittivity determination from propagation constant measurements

Janezic, M.D., Jargon, J.A.

Journal:

IEEE Microwave and Guided Wave Letters

Year:

1999

Language:

english

File:

PDF, 58 KB

english, 1999

6

[IEEE 2002 International Microwave Symposium (MTT 2002) - Seattle, WA, USA (2-7 June 2002)] 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) - Repeat measurements and metrics for nonlinear model development

Remley, K.A., Jargon, J.A., Schreurs, D., DeGroot, D.C., Gupta, K.C.

Year:

2002

Language:

english

File:

PDF, 386 KB

english, 2002

7

Measurement Challenges for 5G and Beyond: An Update from the National Institute of Standards and Technology

Remley, Kate A., Gordon, Joshua A., Novotny, David, Curtin, Alexandra E., Holloway, Christopher L., Simons, Matthew T., Horansky, Robert D., Allman, Michael S., Senic, Damir, Becker, Maria, Jargon, Je

Journal:

IEEE Microwave Magazine

Year:

2017

Language:

english

File:

PDF, 5.27 MB

english, 2017

8

Expanding definitions of gain by taking harmonic content into account

Jeffrey Jargon, K. C. Gupta, Alessandro Cidronali, Donald DeGroot

Journal:

International Journal of RF and Microwave Computer-Aided Engineering

Year:

2003

Language:

english

File:

PDF, 840 KB

english, 2003

9

Behavioral model for reducing the complexity of mixer analysis and design

A. Cidronali, G. Loglio, J. Jargon, G. Manes

Journal:

International Journal of RF and Microwave Computer-Aided Engineering

Year:

2005

Language:

english

File:

PDF, 301 KB

english, 2005

10

Robust SOLT and alternative calibrations for four-sampler vector network analyzers

Jargon, J.A., Marks, R.B., Rytting, D.K.

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

1999

Language:

english

File:

PDF, 183 KB

english, 1999

11

Correcting Sampling Oscilloscope Timebase Errors With a Passively Mode-Locked Laser Phase Locked to a Microwave Oscillator

Jargon, J.A., Hale, P.D., Wang, C.M.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2010

Language:

english

File:

PDF, 965 KB

english, 2010

12

[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Multiline TRL revealed

DeGroot, D.C., Jargon, J.A., Marks, R.B.

Year:

2002

Language:

english

File:

PDF, 1.13 MB

english, 2002

13

Synchronization Monitoring of I/Q Data and Pulse Carving Misalignment for a Parallel-Type RZ-DQPSK Transmitter by Measuring RF Clock Tone/Low Frequency Power

Xiaoxia Wu, Christen, L., Bo Zhang, Wei-Ren Peng, Jeng-Yuan Yang, Lin Zhang, Nuccio, S.R., Paraschis, L., Jargon, J.A., Willner, A.

Journal:

IEEE Photonics Technology Letters

Year:

2008

Language:

english

File:

PDF, 484 KB

english, 2008

14

[IEEE 54th ARFTG Conference Digest - Atlanta, GA, USA (1999.12.2-1999.12.3)] 54th ARFTG Conference Digest - Equivalent Circuit Models for Coaxial OSLT Standards

DeGroot, Donald C., Reed, Kristopher L., Jargon, Jeffrey A.

Year:

2000

Language:

english

File:

PDF, 130 KB

english, 2000

15

[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - Extraction of conversion matrices for P-HEMTs based on vectorial large-signal measurements

Cidronali, A., Gupta, K.C., Jargon, J., Remley, K.A., DeGroot, D., Manes, G.

Year:

2003

Language:

english

File:

PDF, 263 KB

english, 2003

16

[IEEE 2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC) - Leuven, Belgium (2014.04.2-2014.04.4)] 2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC) - Calibrated oscilloscope measurements for system-level characterization of weakly nonlinear sources

Remley, Kate A., Williams, Dylan F., Hale, Paul D., Chih-Ming-Wang,, Jargon, Jeffrey A., Park, Youngcheol

Year:

2014

Language:

english

File:

PDF, 414 KB

english, 2014

17

[IEEE 46th ARFTG Conference Digest - Scottsdale, AZ, USA (1995.11.30-1995.12.1)] 46th ARFTG Conference Digest - Two-Tier Multiline TRL for Calibration of Low-Cost Network Analyzers

Jargon, Jeffrey A., Marks, Roger B.

Year:

1995

Language:

english

File:

PDF, 480 KB

english, 1995

18

[IEEE ARFTG 63rd Conference, Spring 2004 - Fort Worth, TX (June 11, 2004)] ARFTG 63rd Conference, Spring 2004 - Nonlinear large-signal scattering parameters: theory and applications

Jargon, J.A., Gupta, K.C., DeGroot, D.C.

Year:

2004

Language:

english

File:

PDF, 744 KB

english, 2004

19

[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Calculating ratios of harmonically related, complex signals with application to nonlinear large-signal scattering parameters

Jargon, J., DeGroot, D., Gupta, K.C., Cidronalli, A.

Year:

2002

Language:

english

File:

PDF, 480 KB

english, 2002

20

[IEEE 58th ARFTG Conference Digest - San Diego, CA, USA (2001.11.29-2001.11.30)] 58th ARFTG Conference Digest - A Method of Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements

Jargon, Jeffrey, Gupta, K.C., Schreurs, Dominique, Remley, Kate, DeGroot, Donald

Year:

2001

Language:

english

File:

PDF, 88 KB

english, 2001

21

[IEEE 2015 85th ARFTG Microwave Measurement Conference (ARFTG) - Phoenix, AZ, USA (2015.5.22-2015.5.22)] 2015 85th Microwave Measurement Conference (ARFTG) - Calibration of channel mismatch in time-interleaved real-time digital oscilloscopes

Cho, Chihyun, Lee, Joo-Gwang, Hale, Paul D., Jargon, Jeffrey A., Jeavons, Peter, Schlager, John, Dienstfrey, Andrew

Year:

2015

Language:

english

File:

PDF, 1.50 MB

english, 2015

22

[IEEE 2015 85th ARFTG Microwave Measurement Conference (ARFTG) - Phoenix, AZ, USA (2015.5.22-2015.5.22)] 2015 85th Microwave Measurement Conference (ARFTG) - Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework

Jargon, Jeffrey A., Cho, Chihyun, Williams, Dylan F., Hale, Paul D.

Year:

2015

Language:

english

File:

PDF, 1.00 MB

english, 2015

23

[IEEE 2015 85th ARFTG Microwave Measurement Conference (ARFTG) - Phoenix, AZ, USA (2015.5.22-2015.5.22)] 2015 85th Microwave Measurement Conference (ARFTG) - A compact millimeter-wave comb generator for calibrating broadband vector receivers

Hale, Paul D., Remley, Kate A., Williams, Dylan F., Jargon, Jeffrey A., Wang, C. M. Jack

Year:

2015

Language:

english

File:

PDF, 1.47 MB

english, 2015

24

Untersuchungen zur Verformungsalterung stickstoffhaltigen Reineisens durch DÃ¤mpfungs- und Festigkeitsmessungen

Nacken, Mathias, Jargon, Franz

Journal:

Archiv für das Eisenhüttenwesen

Year:

1966

File:

PDF, 1.10 MB

1966

25

[IEEE 2020 94th ARFTG Microwave Measurement Symposium (ARFTG) - San Antonio, TX, USA (2020.1.26-2020.1.29)] 2020 94th ARFTG Microwave Measurement Symposium (ARFTG) - Developing Models for a 0.8 mm Coaxial VNA Calibration Kit within the NIST Microwave Uncertainty Framework

Jargon, Jeffrey A., Long, Christian J., Feldman, Ari, Martens, Jon

Year:

2020

File:

PDF, 146 KB

2020

26

Influence of Noise on Scattering-Parameter Measurements

Gu, Dazhen, Jargon, Jeffrey A., Ryan, Matthew J., Hubrechsen, Anouk

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2020

File:

PDF, 1.82 MB

2020

27

Artificial neural network modeling for improved on-wafer OSLT calibration standards

Jeffrey A. Jargon, K. C. Gupta, Donald C. DeGroot

Journal:

International Journal of RF and Microwave Computer-Aided Engineering

Year:

2000

Language:

english

File:

PDF, 267 KB

english, 2000

28

Artificial neural network modeling for improved coaxial line-reflect-match calibrations

J. A. Jargon, K. C. Gupta

Journal:

International Journal of RF and Microwave Computer-Aided Engineering

Year:

2001

Language:

english

File:

PDF, 116 KB

english, 2001

29

Applications of artificial neural networks to RF and microwave measurements

Jeffrey A. Jargon, K. C. Gupta, Donald C. DeGroot

Journal:

International Journal of RF and Microwave Computer-Aided Engineering

Year:

2002

Language:

english

File:

PDF, 433 KB

english, 2002

30

Evidence for a tungsten-stimulated aldehyde dehydrogenase activity of Desulfovibrio simplex that oxidizes aliphatic and aromatic aldehydes with flavins as coenzymes

G. Zellner, Anke Jargon

Journal:

Archives of Microbiology

Year:

1997

Language:

english

File:

PDF, 60 KB

english, 1997

31

An Empirical Model for the Warm-Up Drift of a Commercial Harmonic Phase Standard

Jargon, J. A., Splett, J., Vecchia, D. F., DeGroot, D. C.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2007

Language:

english

File:

PDF, 271 KB

english, 2007

32

On Peculiarities of S-Parameter Measurements

Rolain, Y., Van Moer, W., Jargon, J.A., DeGroot, D.C.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2007

Language:

english

File:

PDF, 382 KB

english, 2007

33

A Statistical Study of De-Embedding Applied to Eye Diagram Analysis

Hale, P.D., Jargon, J., Wang, C.M.J., Grossman, B., Claudius, M., Torres, J.L., Dienstfrey, A., Williams, D.F.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2012

Language:

english

File:

PDF, 543 KB

english, 2012

34

Effects of antibodies against octreotide in two patients with acromegaly

Hans Ørskov, Stig Engkjær Christensent, Jargon Weeket, Andreas Kaal, Alan G. Harris

Journal:

Clinical Endocrinology

Year:

1991

Language:

english

File:

PDF, 332 KB

english, 1991

35

A Robust Algorithm for Eye-Diagram Analysis

Jargon, J.A., Wang, C.M., Hale, P.D.

Journal:

Journal of Lightwave Technology

Year:

2008

Language:

english

File:

PDF, 1.36 MB

english, 2008

36

Applications of Artificial Neural Networks in Optical Performance Monitoring

Xiaoxia Wu, Jargon, J.A., Skoog, R.A., Paraschis, L., Willner, A.E.

Journal:

Journal of Lightwave Technology

Year:

2009

Language:

english

File:

PDF, 2.21 MB

english, 2009

37

Optical performance monitoring of QPSK data channels by use of neural networks trained with parameters derived from asynchronous constellation diagrams

Jargon, Jeffrey A., Wu, Xiaoxia, Choi, Hyeon Yeong, Chung, Yun C., Willner, Alan E.

Journal:

Year:

2010

Language:

english

File:

PDF, 252 KB

english, 2010

38

“Net Words”: A Multimedia Glossary

R. Williams, Cummings S. Jargon

Journal:

Journal of Nutrition Education

Year:

1996

Language:

english

File:

PDF, 324 KB

english, 1996

39

[IEEE 1996 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA, USA (17-21 June 1996)] 1996 IEEE MTT-S International Microwave Symposium Digest - Measuring complex permittivity and permeability using time domain network analysis

Jargon, J.A., Janezic, M.D.

Year:

1996

Language:

english

File:

PDF, 286 KB

english, 1996

40

[IEEE 2012 80th ARFTG Microwave Measurement Conference - San Diego, CA, USA (2012.11.29-2012.11.30)] 80th ARFTG Microwave Measurement Conference - Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST Uncertainty Framework

Jargon, Jeffrey A., Arz, Uwe, Williams, Dylan F.

Year:

2012

Language:

english

File:

PDF, 941 KB

english, 2012

41

MMP-9 in Serum Correlates with the Development of Pulmonary Complications in Experimental Acute Pancreatitis

Keck, T., Jargon, D., Klünsch, A., Thomusch, O., Richter, S., Friebe, V., Adam, U., Hopt, U.T.

Journal:

Year:

2006

Language:

english

File:

PDF, 250 KB

english, 2006

42

Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates

Milanovic, V., Ozgur, M., DeGroot, D.C., Jargon, J.A., Gaitan, M., Zaghloul, M.E.

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

1998

Language:

english

File:

PDF, 233 KB

english, 1998

43

[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - A method to compare vector nonlinear network analyzers

Remley, K.A., Degroot, D.C., Jargon, J.A., Gupta, K.C.

Year:

2001

Language:

english

File:

PDF, 390 KB

english, 2001

44

[IEEE 52nd ARFTG Conference Digest - Rohnert Park, CA, USA (1998.12.3-1998.12.4)] 52nd ARFTG Conference Digest - NIST Passive Intermodulation Measurement Comparison for Wireless Base Station Equipment

Jargon, Jeffrey A., DeGroot, Donald C., Reed, Kristopher L.

Year:

1998

Language:

english

File:

PDF, 644 KB

english, 1998

45

[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework

Jargon, Jeffrey A., Williams, Dylan F., Wallis, T. Mitch, LeGolvan, Denis X., Hale, Paul D.

Year:

2012

Language:

english

File:

PDF, 664 KB

english, 2012

46

[IEEE 50th ARFTG Conference Digest - Portland, OR, USA (1997.12.4-1997.12.5)] 50th ARFTG Conference Digest - A Method for Comparing Vector Network Analyzers

DeGroot, Donald C., Marks, Roger B., Jargon, Jeffrey A.

Year:

1997

Language:

english

File:

PDF, 640 KB

english, 1997

47

[IEEE 65th ARFTG Conference Digest, 2005. Spring 2005 - Long Beach, CA, USA (17 June 2005)] 65th ARFTG Conference Digest, 2005. Spring 2005 - On peculiarities of S-parameter measurements

Rolain, Y., Van Moer, W., Jargon, J., DeGroot, D.

Year:

2005

Language:

english

File:

PDF, 896 KB

english, 2005

48

[IEEE 44th ARFTG Conference Digest - Boulder, CO, USA (1994.12.1-1994.12.2)] 44th ARFTG Conference Digest - Time Domain Network Analysis using the Multiline TRL Calibration

Marks, Roger B., Hayden, Leonard A., Jargon, Jeffrey A., Williams, Frank

Year:

1994

Language:

english

File:

PDF, 427 KB

english, 1994

49

[IEEE 2014 83rd ARFTG Microwave Measurement Conference (ARFTG) - Tampa, FL, USA (2014.6.6-2014.6.6)] 83rd ARFTG Microwave Measurement Conference - Characterizing a noninsertable directional device using the NIST uncertainty framework

Jargon, Jeffrey A., Williams, Dylan F., Hale, Paul D., Janezic, Michael D.

Year:

2014

Language:

english

File:

PDF, 613 KB

english, 2014

50

[IEEE 62nd ARFTG Microwave Measurements Conference - Boulder, CO, USA (4-5 Dec. 2003)] Conference, 2003. Fall 2003. 62nd ARFTG Microwave Measurements - Design and characterization of a superconducting nonlinear reference device

Booth, J.C., Leong, K., Schima, S.A., Jargon, J.A., DeGroot, D.C.

Year:

2003

Language:

english

File:

PDF, 1.49 MB

english, 2003